Implementation of Concurrent Online MBIST for RFID Memories using March SS Algorithm
M. Jahnavi1, P. S. Indrani2, M. J. C. Prasad3
1M. Jahnavi, P.G Scholar, Department of ECE, Mallareddy Engineering College, Secunderabad (Telangana), India.
2P. S. Indrani, Associate Professor, Department of ECE, Mallareddy Engineering College, Secunderabad (Telangana), India.
3Dr. M. J. C. Prasad, Department of ECE, Mallareddy Engineering College, Secunderabad, (Telangana), India.
Manuscript received on 10 November 2013 | Revised Manuscript received on 18 November 2013 | Manuscript Published on 30 November 2013 | PP: 88-92 | Volume-3 Issue-6, November 2013 | Retrieval Number: F1345113613/13©BEIESP
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© The Authors. Blue Eyes Intelligence Engineering and Sciences Publication (BEIESP). This is an open access article under the CC-BY-NC-ND license (http://creativecommons.org/licenses/by-nc-nd/4.0/)
Abstract: This paper presents the implementation of online test scheme for RFID memories based on Memory Built in Self Test (MBIST) architecture. This paper also presents the, Symmetric transparent version of March SS algorithm, implementation of Memory BIST. The comparison between the different march algorithms and the advantage of the March SS algorithm over all other is also presented. The solution was implemented using Verilog HDL and was, in turn, verified on Xilinx ISE 13.2 simulator, and synthesized.
Keywords: Memory Testing, RFID Memories, Transponder.
Scope of the Article: Algorithm Engineering