Reduction of Test Data with Hybrid Test Points
P.S.L.Tanuja1, K.Prasanthi2

1P.S.L.Tanuja*, PG Scholar, Department of ECE, Sri Padmavati Mahila Visvavidyalayam, Andhra Pradesh, India.
2Mrs.K.Prasanthi, Assistant Professor, Department of ECE, Sri Padmavati Mahila Visvavidyalayam, Andhra Pradesh, India.
Manuscript received on December 15, 2019. | Revised Manuscript received on December 20, 2019. | Manuscript published on January 10, 2020. | PP: 2535-2538 | Volume-9 Issue-3, January 2020. | Retrieval Number: C7969019320/2020©BEIESP | DOI: 10.35940/ijitee.C7969.019320
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Abstract: ATPG vectors for a combinational circuit exhibit correlations among the bits of a test vector. We propose a BIST circuit design methodology using spectral methods which utilizes the correlation information. This circuit serves dual purposes. It generates BIST vectors that are similar to the ATPG vectors with higher test coverage as compared to random and weighted random vectors. The same circuit can also function as a test data de-compressor for compressed ATPG vectors applied from an external tester. Logic built-in self-test (LBIST) is now increasingly used with on-chip test compression as a complementary solution for in-system test, where high quality, low power, low silicon area, and most importantly short test application time are key factors affecting ICs targeted for safety-critical systems. Test points, common in LBIST-ready designs, can help to reduce test time and the overall silicon overhead so that one can get desired test coverage with the minimal number of patterns. Typically, LBIST test points are dysfunctional when enabled in an ATPG-based test compression mode. Similarly, test points used to reduce ATPG pattern counts cannot guarantee desired random testability. We present a hybrid test point technology designed to reduce deterministic pattern counts and to improve fault detection likelihood by means of the same minimal set of test points. The hybrid test points are subsequently deployed in a scan-based LBIST scheme addressing stringent test requirements of certain application domains such as the automotive electronics market. These requirements, largely driven by safety standards, are met by significantly reducing test application time while preserving the high fault coverage. The new scheme is a combination of pseudorandom test patterns delivered in a test-per-clock fashion through conventional scan chains and per cycle-driven hybrid observation test points that capture faulty effects every shift cycle into dedicated scan chains. We also exhibit test data compression capabilities of the proposed BIST architecture. This architecture provides a maximum test data compression exceeding and a proportional test time reduction for serial interface reseeding. 
Keywords: Design for Testability, Embedded Test, logiLc Built in Self-test, Scan-Based Testing, Test Points.
Scope of the Article:  Data Mining