An Efficient Technique Used to Generate Test Case on Embedded System using Fuzzy Logic
Mannini Goyal, Department of Computer Science and Technology, Lovely Professional University, Phagwara (Punjab), India.
Manuscript received on 11 June 2013 | Revised Manuscript received on 17 June 2013 | Manuscript Published on 30 June 2013 | PP: 144-147 | Volume-3 Issue-1, June 2013 | Retrieval Number: A0928063113/13©BEIESP
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© The Authors. Blue Eyes Intelligence Engineering and Sciences Publication (BEIESP). This is an open access article under the CC-BY-NC-ND license (http://creativecommons.org/licenses/by-nc-nd/4.0/)
Abstract: Logical generation of the test case process ensures that the test cases have been derived in a consistent and objective manner and which covers all the requirements of the system. Temperature monitoring and controlling of nuclear reactor system is used which is an embedded system in which simulation is done and fuzzy logic is used to generate the test cases. The goal of my paper is to make a more efficient technique that could find the least number of test cases of the output domain for the hardware so that we can analyse the accuracy. Fuzzy logic is best technique because it reduces the test cases of an output domain in few second and gives the correct result. As the test cases are reduced, it will increase the performance of the system and save the time, effort of the user.
Keywords: Test Case, Embedded System, Fuzzy Logic, Output Domain.
Scope of the Article: Embedded Networks