Managing Inrush Current using Hot Swap and ORing FET
Raji.C1, Mohan Kumar Velumani2, S. N. Prasad3

1Prof. Raji. C., Assistant Professor, Department of VLSI, REVA University, Bangalore, India.
2Mr. Mohan Kumar Velumani, Department of VLSI, REVA University, Bangalore, India.
3Dr. S. N. Prasad, Professor, Department of ECE

Manuscript received on October 12, 2019. | Revised Manuscript received on 22 October, 2019. | Manuscript published on November 10, 2019. | PP: 4645-4649 | Volume-9 Issue-1, November 2019. | Retrieval Number: A4874119119/2019©BEIESP | DOI: 10.35940/ijitee.A4874.119119
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Abstract: Critical, high availability systems will always rely on redundant power for continuous operation when the default power fails or becomes unavailable. When the back-up system kicks in, there will be a huge inrush current depending on load. The consequences of inrush current can be reduction of output voltage, tripping of protective devices, damage to sensitive devices either on at the load or on the back-up system itself and eventually system failure. This dissertation studies the effects of inrush current on an already existing Redundant Power Distribution System (RPDS). A review of existing technique to control inrush current is presented. A new solution has been implemented on the Redundant Power Distribution System such that the functionality of overall system is preserved. Finally, performance of existing solution on RPDS and new solution are compared.
Keywords: Inrush Current, RPDS
Scope of the Article: Computer Architecture and VLSI